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Realization of 70-nm T-gate InP-based PHEMT for MMW low noise applications.
Zhi-Ming Wang
Xin Lv
Zhi-Fu Hu
Xiaobin Luo
Yu-Xing Cui
Xi-Guo Sun
Jiang-Hui Mo
Xing-Chang Fu
Published in:
IEICE Electron. Express (2015)
Keyphrases
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high noise
low signal to noise ratio
image reconstruction
noise reduction
noisy data
cmos technology
noise level
additive noise
random noise
signal to noise ratio
high levels
image processing
leakage current
power spectrum
noise model
noise removal
low snr
median filter
real time
nm technology