A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test.
Shigeki TomishimaHiroaki TanizakiMitsutaka NiiroMasanao MarutaHideto HidakaT. TadaKenji GamoPublished in: ITC (2002)
Keyphrases
- high frequency
- low frequency
- high resolution
- visual quality
- wavelet transform
- high frequencies
- subband
- wavelet coefficients
- low pass
- discrete wavelet transform
- wavelet decomposition
- multi resolution analysis
- feature selection
- power supply
- machine learning
- integrated circuit
- video quality
- image reconstruction
- feature vectors
- high frequency components
- image segmentation
- low bit rate coding