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Comparison of hafnia and PZT based ferroelectrics for future non-volatile FRAM applications.

Franz P. G. FenglerMilan PesicSergej StarschichTheodor SchnellerUlrich BottgerTony SchenkMin Hyuk ParkThomas MikolajickUwe Schroeder
Published in: ESSDERC (2016)
Keyphrases
  • long term
  • data storage
  • real time
  • statistical analysis
  • neural network
  • knowledge base
  • case study
  • natural language
  • object recognition
  • information technology
  • success or failure
  • predicting future