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An efficient methodology for building macromodels of IC fabrication processes.

K. K. LowStephen W. Director
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
  • integrated circuit
  • process model
  • multiscale
  • high density
  • high speed
  • statistical methods
  • communication channels
  • data sets
  • information systems
  • multi agent
  • data structure
  • design methodology
  • electron beam