Sign in
Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated Circuits.
Zhengqi Gao
Zihao Chen
Jun Tao
Yangfeng Su
Dian Zhou
Xuan Zeng
Published in:
ASP-DAC (2021)
Keyphrases
</>
bayesian inference
prior information
integrated circuit
probabilistic model
data sets
feature selection
em algorithm
segmentation method
hyperparameters
search space
prior knowledge
parameter estimation
parametric models
probabilistic modeling