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Read static noise margin aging model considering SBD and BTI effects for FinFET SRAMs.
Kolsoom Mehrabi
Behzad Ebrahimi
Roohollah Yarmand
Ali Afzali-Kusha
Hamid Mahmoodi
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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probabilistic model
computational model
mathematical model
database
multiscale
objective function
maximum likelihood
formal model
social networks
image sequences
support vector
theoretical analysis
prediction model
noise level
autoregressive