A Low Power Pseudo-Random BIST Technique.
Nadir Z. BasturkmenSudhakar M. ReddyIrith PomeranzPublished in: J. Electron. Test. (2003)
Keyphrases
- low power
- pseudorandom
- low cost
- power consumption
- high speed
- random number
- uniformly distributed
- random numbers
- secret key
- wireless transmission
- single chip
- digital signal processing
- cmos technology
- low power consumption
- vlsi architecture
- high power
- image sensor
- vlsi circuits
- signal processor
- built in self test
- ultra low power
- power dissipation
- mixed signal
- file system