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Tolerance Considerations for MHMIC Manufacturing Process at Millimeter-Wave Band.
Chaouki Hannachi
Matthieu Egels
Philippe Pannier
Serioja Ovidiu Tatu
Published in:
Sensors (2024)
Keyphrases
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manufacturing process
millimeter wave
radar images
process control
quality control
physical phenomena
manufacturing systems
imaging process
control system
sar imagery
product design
discrete event
product quality
image formation
mathematical models
imaging systems
computer vision
parameter estimation
case study