Fault simulation of a wafer-scale integrated neural network.
Norm MayDan HammerstromPublished in: Neural Networks (1988)
Keyphrases
- neural network
- fault diagnosis
- artificial neural networks
- fault detection
- genetic algorithm
- integrated circuit
- simulation model
- neural network is trained
- numerical simulations
- self organizing maps
- back propagation
- scale space
- feed forward
- fuzzy logic
- fuzzy neural network
- expert systems
- learning vector quantization
- semiconductor manufacturing
- data sets