Adjacent-MBU-Tolerant SEC-DED-TAEC-yAED Codes for Embedded SRAMs.

Adam Neale Maarten Jonkman Manoj Sachdev

Published in: IEEE Trans. Circuits Syst. II Express Briefs (2015)

Keyphrases

error correction
error detection
embedded systems
neural network
database
real time
data sets
databases
feature selection