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Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices.
Jing-Jia Liou
Angela Krstic
Yi-Min Jiang
Kwang-Ting Cheng
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
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data analysis
quantitative analysis
database
statistical analysis
additive noise
sufficient conditions
static analysis