JMIV Special Issue - Mathematics and Image Analysis.
Gabriel PeyréLaurent D. CohenJoachim WeickertPublished in: J. Math. Imaging Vis. (2011)
Keyphrases
- special issue
- image analysis
- ai edam
- pattern recognition
- international journal
- ecml pkdd
- image processing
- visual inspection
- mathematical morphology
- computer vision
- remote sensing
- applied intelligence
- special section
- texture classification
- image segmentation
- computer science
- texture analysis
- databases
- artificial neural networks
- artificial intelligence
- data mining