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A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM.

Chih-Wea WangChi-Feng WuJin-Fu LiCheng-Wen WuTony TengKevin ChiuHsiao-Ping Lin
Published in: J. Electron. Test. (2002)
Keyphrases
  • detection scheme
  • databases
  • data mining
  • information systems
  • genetic algorithm
  • expert systems
  • mobile devices
  • business processes
  • embedded systems
  • classification scheme