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A Test Generation Method for Sequential Circuits Based on Maximum Utilization of Internal States.

Toshinobu OnoMasaaki Yoshida
Published in: ITC (1991)
Keyphrases
  • generation method
  • internal states
  • input output
  • feature generation
  • high speed
  • internal state
  • genetic algorithm
  • social networks
  • case study
  • expert systems
  • sequential data
  • built in self test