Toshinobu Ono

Publication Activity (10 Years)

Years Active: 1991-2001
Publications (10 Years): 0

Publications

Toshinobu Ono, Akira Kozawa, Takashi Kimura, Yoshihiro Konno, Koji Saga
An Application of Partial Scan Techniques to a High-End System LSI Design. Asian Test Symposium (2001)
Toshinobu Ono, Kazuo Wakui, Hitoshi Hikima, Yoshiyuki Nakamura, Masaaki Yoshida
Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. Asian Test Symposium (1997)
Toshinobu Ono
Selecting partial scan flip-flops for circuit partitioning. ICCAD (1994)
Toshinobu Ono, Masaaki Yoshida
A Test Generation Method for Sequential Circuits Based on Maximum Utilization of Internal States. ITC (1991)