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An Application of Partial Scan Techniques to a High-End System LSI Design.

Toshinobu OnoAkira KozawaTakashi KimuraYoshihiro KonnoKoji Saga
Published in: Asian Test Symposium (2001)
Keyphrases
  • high end
  • user interface
  • real time
  • low end
  • real world
  • general purpose
  • fine grained
  • software architecture
  • fixed point
  • computing systems