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Delay testing of SOI circuits: Challenges with the history effect.
Eric MacDonald
Nur A. Touba
Published in:
ITC (1999)
Keyphrases
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power dissipation
lessons learned
open issues
neural network
technical challenges
real world
real time
web services
high speed
test set
test cases
data mining
key issues
finite state machines
software testing
analog circuits
quantum computing