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A robust 8T FinFET SRAM cell with improved stability for low voltage applications.

C. B. KushwahDevesh DwivediN. SathishaKrishnan S. Rengarajan
Published in: VDAT (2016)
Keyphrases
  • low voltage
  • random access memory
  • design considerations
  • power line
  • power consumption
  • leakage current
  • power management
  • real time
  • data transmission
  • cmos technology
  • data streams
  • sensor networks