Special section on 19th Scandinavian conference on image analysis (SCIA 2015).
Kim Steenstrup PedersenRasmus R. PaulsenPublished in: Pattern Recognit. Lett. (2016)
Keyphrases
- special section
- image analysis
- conference on artificial intelligence
- advances in artificial intelligence
- special issue
- pattern recognition
- image understanding
- visual inspection
- computer vision
- selected papers
- texture classification
- image segmentation
- remote sensing
- graphics and image processing
- image processing
- invited talk
- international conference
- workshop proceedings
- mathematical morphology
- medical imaging
- image enhancement
- scale space
- asia pacific
- cutting edge
- keynote address
- panel discussion
- invited paper
- feature extraction
- award winning
- brain imaging
- image registration
- annual conference
- document analysis
- knowledge discovery and data mining