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Field and hot electron-induced degradation in GaN-based power MIS-HEMTs.

Alaleh TajalliMatteo MeneghiniIsabella RossettoPeter MoensAbhishek BanerjeeEnrico ZanoniGaudenzio Meneghesso
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • electric field
  • computer vision
  • information systems
  • search algorithm
  • power consumption
  • information management
  • management information systems
  • data sets
  • image processing