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The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features.
Piotr Jantos
Damian Grzechca
Tomasz Golonek
Jerzy Rutkowski
Published in:
DDECS (2008)
Keyphrases
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electronic circuits
global features
image features
extracted features
global information
feature extraction
expert systems
low level
co occurrence
feature set
frequency domain
neural network
benchmark datasets
structural information
fault detection
global structure