Model-Free Testing of Analog Circuits.
Mehrdad HeydarzadehHao LuoMehrdad NouraniPublished in: ATS (2016)
Keyphrases
- model free
- analog circuits
- reinforcement learning
- fault diagnosis
- digital circuits
- function approximation
- reinforcement learning algorithms
- policy iteration
- temporal difference
- neural network
- support vector
- state space
- dynamic systems
- impedance control
- policy evaluation
- markov decision processes
- particle filter
- active learning
- decision trees
- image processing
- machine learning
- real time