Knitted fabric defect classification for uncertain labels based on Dempster-Shafer theory of evidence.
Mahdi TabassianReza GhaderiReza EbrahimpourPublished in: Expert Syst. Appl. (2011)
Keyphrases
- dempster shafer theory of evidence
- defect classification
- pairwise
- artificial intelligence
- class labels
- multi label
- training set
- active learning
- incomplete information
- uncertain information
- weakly labeled
- real time
- multiresolution
- probability distribution
- image classification
- training examples
- defect detection
- training data