Login / Signup
Signatures Reduce Defect Level and Yield Loss.
Lan Rao
Michael L. Bushnell
Vishwani D. Agrawal
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2007)
Keyphrases
</>
levels of abstraction
higher level
knowledge base
signature verification
database
real time
data sets
real world
artificial intelligence
case study
search algorithm
wireless sensor networks