Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware.
Barry John MuldreySabyasachi DeyatiAbhijit ChatterjeePublished in: VLSI Design (2017)
Keyphrases
- iterative learning
- low cost
- iterative learning control
- data acquisition
- incremental learning
- hardware and software
- field effect transistors
- semiconductor devices
- real time
- hardware implementation
- silicon on insulator
- error reduction
- high density
- high speed
- trajectory tracking
- supervised learning
- significant improvement