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Ridge-Based DPA: Improvement of Differential Power Analysis For Nanoscale Chips.
Weijia Wang
Yu Yu
François-Xavier Standaert
Junrong Liu
Zheng Guo
Dawu Gu
Published in:
IEEE Trans. Inf. Forensics Secur. (2018)
Keyphrases
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differential power analysis
power analysis
smart card
s box
countermeasures
high speed
significant improvement
integrated circuit
atomic force microscopy
data mining
information systems
high density
mechanical properties