A 12b 200MS/s frequency scalable zero-crossing based pipelined ADC in 55nm CMOS.
Soon-Kyun ShinJacques Christophe RudellDenis C. DalyCarlos E. MuñozDong-Young ChangKush GulatiHae-Seung LeeMatthew Z. StraayerPublished in: CICC (2012)
Keyphrases
- zero crossing
- band limited
- scale space
- cmos technology
- analog to digital converter
- edge detector
- edge detection
- low cost
- wavelet transform
- silicon on insulator
- power consumption
- directional derivatives
- gray scale images
- marr hildreth
- image intensity
- low power
- palmprint
- nm technology
- high speed
- single chip
- metal oxide semiconductor
- image space
- medical images