Recent Advances and Current Trends in Transmission Tomographic Diffraction Microscopy.
Nicolas VerrierMatthieu DebailleulOlivier HaeberléPublished in: Sensors (2024)
Keyphrases
- recent advances
- current trends
- electron microscopy
- electron microscope
- x ray
- future directions
- three dimensional
- artificial intelligence
- noise level
- transmission electron microscopy
- researchers and practitioners
- thin film
- image analysis
- multimedia processing
- microscopy images
- recent developments
- pattern recognition
- signal processing
- multi class
- image data
- image reconstruction
- texture features
- computer vision
- neural network