On-Chip Cache Device Scaling Limits and Effective Fault Repair Techniques in Future Nanoscale Technology.

David Roberts Nam Sung Kim Trevor N. Mudge

Published in: DSD (2007)

Keyphrases

cost effective
memory subsystem
fault detection
high speed
silicon on insulator
neural network
long term
future trends
low cost
client server
high density
paradigm shift
desktop computers
read write
electronic devices
query processing
case study