A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test.
Masaru HaraguchiTokuya OsawaAkira YamazakiChikayoshi MorishimaToshinori MoriharaYoshikazu MorookaYoshihiro OkunoKazutami ArimotoPublished in: IEICE Trans. Electron. (2009)