Development of Inspection System for IC Lead Frame Defects.

Hirokazu Tsuji Kazuo Maruyama

Published in: J. Robotics Mechatronics (1993)

Keyphrases

development environment
visual inspection
software engineering
knowledge management
decision support
integrated circuit
data mining
case study
multiscale
digital libraries
optical flow
information processing
machine vision
design principles
frame rate
reference frame