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Data quality problems in discrete event simulation of manufacturing operations.
Jon Bokrantz
Anders Skoogh
Dan Lämkull
Atieh Hanna
Terrence Perera
Published in:
Simul. (2018)
Keyphrases
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data quality
discrete event simulation
semiconductor manufacturing
real world
manufacturing systems
quality assessment
information loss
data cleaning
real time
metaheuristic
poor quality
data transformation