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Data quality problems in discrete event simulation of manufacturing operations.

Jon BokrantzAnders SkooghDan LämkullAtieh HannaTerrence Perera
Published in: Simul. (2018)
Keyphrases
  • data quality
  • discrete event simulation
  • semiconductor manufacturing
  • real world
  • manufacturing systems
  • quality assessment
  • information loss
  • data cleaning
  • real time
  • metaheuristic
  • poor quality
  • data transformation