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The 5ESS switching system: Factory system testing.

John P. DelatoreMonte P. TullD. Van Haften
Published in: AT&T Tech. J. (1985)
Keyphrases
  • test cases
  • manufacturing systems
  • database
  • data mining
  • machine learning
  • artificial intelligence
  • face recognition
  • training set
  • relational databases
  • test set
  • test generation