Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing.

Hsiu-Ming (Sherman) Chang David C. Keezer

Published in: J. Electron. Test. (2012)

Keyphrases

special issue
mixed signal
low power
multi channel
vlsi circuits
analog to digital converter
digital circuits
ai edam
ecml pkdd
cmos technology
international journal
low cost
power consumption
high speed
special section
applied intelligence
radio frequency
low voltage
machine learning
wireless sensor networks