Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs.

Masayuki Kamei Yoshinori Takao Koji Eriguchi Kouichi Ono

Published in: ICICDT (2014)

Keyphrases

image sequences
noise level
random noise
missing data
noise reduction
image noise
noisy data
noise model
database systems
signal to noise ratio
data mining
high energy
low snr
background noise
noise free
high density
power consumption
image processing
data sets
scanning electron microscope