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A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing.

Kuen-Jong LeeChing-An LiuChia-Chi Wu
Published in: IEEE Trans. Emerg. Top. Comput. (2022)
Keyphrases
  • real time
  • management system
  • dynamic environments
  • test cases
  • network architecture
  • encryption key
  • software architecture
  • multi layer
  • key technologies
  • integrated circuit
  • security issues