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Numerical analysis of impact of stress in passivation films on electrical properties in AlGaN/GaN heterostructures.
Naoteru Shigekawa
Suehiro Sugitani
Published in:
IEICE Electron. Express (2009)
Keyphrases
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numerical analysis
electrical properties
image enhancement
film thickness
finite difference
silicon nitride
image analysis
machine learning
search engine
pattern recognition
multiresolution
structuring elements
high impact