A robust SVM-based approach with feature selection and outliers detection for classification problems.
Marta Baldomero-NaranjoLuisa I. Martínez-MerinoAntonio M. Rodríguez-ChíaPublished in: Expert Syst. Appl. (2021)
Keyphrases
- feature selection
- support vector
- support vector machine
- multi class
- robust statistics
- knn
- support vector machine svm
- object detection
- detecting outliers
- partial occlusion
- feature space
- bayes classifier
- machine learning
- feature extraction
- selected features
- detection algorithm
- outlier rejection
- outlier detection
- multi task
- anomaly detection
- gene selection
- text classifiers
- robust regression
- maximum margin
- mutual information
- input features
- small sample
- robust statistical
- training data
- false positives
- support vector classification
- multi class classification
- feature selection algorithms
- microarray data
- svm classifier
- text classification
- feature set
- dimensionality reduction
- classification accuracy
- feature vectors
- learning algorithm