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2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT Architectures.

Yassine FkihPascal VivetBruno RouzeyreMarie-Lise FlottesGiorgio Di NataleJuergen Schloeffel
Published in: ISVLSI (2014)
Keyphrases
  • pattern matching
  • frequency domain
  • data mining
  • image content
  • data sets
  • information retrieval
  • information systems
  • denoising
  • wireless networks
  • fourier transform
  • motion capture