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Path Delay Testing: Variable-Clock Versus Rated-Clock.

Subhashis MajumderMichael L. BushnellVishwani D. Agrawal
Published in: VLSI Design (1998)
Keyphrases
  • high speed
  • power consumption
  • neural network
  • search algorithm
  • real world
  • machine learning
  • shortest path
  • test set