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Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions.
Margrit R. Krug
Marcelo Lubaszewski
Marcelo de Souza Moraes
Published in:
VLSI-SoC (2006)
Keyphrases
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test data
neural network
low cost
databases
information retrieval
high level
higher level
principal components
automatically generated
levels of abstraction