Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response.
V. S. PershenkovS. V. AvdeevA. S. TsimbalovM. N. LevinV. V. BelyakovD. V. IvashinA. Y. SlesarevA. Y. BashinGennady I. ZebrevViktor N. UlimovPublished in: Microelectron. Reliab. (2002)