Automated Indexing Of TEM Diffraction Patterns Using Machine Learning.
Nathaniel TomczakSanmukh KuppannagariPublished in: HPEC (2023)
Keyphrases
- machine learning
- transmission electron microscopy
- x ray
- indexing method
- text retrieval
- machine learning methods
- knowledge acquisition
- machine learning algorithms
- explanation based learning
- knowledge representation
- information retrieval
- knowledge discovery
- electron microscopy
- indexing scheme
- semi automated
- computational biology
- pattern discovery
- computer vision
- pattern mining
- feature selection
- infrared
- pattern recognition
- text classification
- natural language processing
- interesting patterns
- databases
- query processing
- access methods
- information extraction
- data mining techniques
- artificial intelligence
- signal processing
- learning systems
- fully automated
- inductive learning
- similarity measure
- database
- frequent patterns