Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?.

Sebastià A. Bota M. Rosales José Luis Rosselló Jaume Segura

Published in: VTS (2006)

Keyphrases

high correlation
highly correlated
distance measure
metric space
negative correlation
three dimensional
image registration
correlation coefficient
high dimensional
response time
distance function
false positives
end to end