LoOp: Looking for Optimal Hard Negative Embeddings for Deep Metric Learning.
Bhavya VasudevaPuneesh DeoraSaumik BhattacharyaUmapada PalSukalpa ChandaPublished in: CoRR (2021)
Keyphrases
- metric learning
- dimensionality reduction
- distance metric
- distance metric learning
- multi task
- learning tasks
- machine learning and pattern recognition
- semi supervised
- distance function
- mahalanobis metric
- nearest neighbor classification
- pairwise
- pattern recognition
- image processing
- text mining
- vector space
- data points
- euclidean space
- feature space
- semi supervised clustering
- semi definite programming
- data mining
- neural network