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Improving the Reliability/Cost Ratio of Goniophotometric Comparisons.

Aravind KrishnaswamyGladimir V. G. BaranoskiJon G. Rokne
Published in: J. Graphics, GPU, & Game Tools (2004)
Keyphrases
  • failure rate
  • reliability analysis
  • high cost
  • database
  • e learning
  • clustering algorithm
  • data structure
  • multi class
  • expected cost
  • cost effectiveness
  • replacement policy