ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method.

Maria Angeles Jalón Eduardo J. Peralías

Published in: J. Electron. Test. (2010)

Keyphrases

low cost
dynamic programming
high accuracy
test data
segmentation method
pairwise
cost function
experimental evaluation
preprocessing
significant improvement
probabilistic model
classification accuracy
support vector machine
support vector machine svm
detection method
synthetic data