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Delay Test Generation 2: Algebra and Algorithms.

Vijay S. IyengarBarry K. RosenIlan Y. Spillinger
Published in: ITC (1988)
Keyphrases
  • test generation
  • learning algorithm
  • error rate
  • machine learning
  • information systems
  • image processing
  • case study
  • database systems
  • data structure
  • computational complexity