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Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area.
Guan-Cheng Wang
Yan Zhu
Chi-Hang Chan
Seng-Pan U
Rui Paulo Martins
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2018)
Keyphrases
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error rate
high accuracy
relative error
low cost
prediction accuracy
error analysis
average error
maximum error
high speed
highly accurate
data sets
classification accuracy
post processing
error tolerance
generalization error