Statistical Analysis of Read Static Noise Margin for Near/Sub-Threshold SRAM Cell.
Roghayeh SaeidiMohammad SharifkhaniKhosrow HajsadeghiPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2014)
Keyphrases
- statistical analysis
- stochastic resonance
- power consumption
- noisy data
- support vector
- random noise
- noise model
- statistical methods
- signal to noise ratio
- median filter
- noise reduction
- neural network
- missing data
- data transmission
- gaussian noise
- power system
- input data
- low signal to noise ratio
- statistical analyses
- feature selection